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Essair™ Duplex

Essair™ Duplex

ESSAIR™ DUPLEX is a measurement technology, patented by Electronic Systems, ideal for direct thickness measurement without contact.

It does not make use of any type of radioactive sources.
Direct thickness measurement expressed in micron or mm.
No contact with the material.
Automatic calibration system.

ESSAIR™  DUPLEX is installed on standard scanners for measurement in transmission mode, and is particularly suitable for rigid materials or for materials with a very high
winding tension measurement.
The sensor can be personalised depending on specific needs required by the application:

• Edges detector
• Security system to detect lumps and/or extra thickness (lump-detector), external to the measurement system

ESSAIR™  DUPLEX sensor is assembled on board of the following screening devices with its own reference roll between the ones included in the range of Electronic Systems products:



Industry application Composites, PVC calendering, Rubber, Sheets & foils

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